Skip to content
Free delivery across IndiaCash on delivery
BooksBajar
Cover of Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by Dale E. Newbury, Charles E. Fiori, David C. Joy, Joseph I. Goldstein, Patrick Echlin

Springer Verlag · 2013

₹9,969

Free delivery. Nothing extra to pay at checkout.

  • Delivery in 3–7 days to any serviceable pincode in India, with tracking.
  • Cash on delivery. Pay when the parcel reaches you.
  • 15-day returns. See what qualifies.

About this book

Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Dale E. Newbury, Charles E. Fiori & others is a 454-page book published by Springer Verlag in 2013.

Its main subjects are Scanning electron microscopes and Microscopy.

Book details

ISBN-13
9781475790290
ISBN-10
1475790295
Authors
Dale E. Newbury, Charles E. Fiori, David C. Joy, Joseph I. Goldstein, Patrick Echlin
Published
2013
Edition
Reprint
Pages
454
Language
English
Condition
New

More in Sciences, Technology & Medicine

See all