
X-rays for Archaeology
M. Uda, G. Demortier, I. Nakai
₹4,663

Springer-Verlag New York Inc. · 2013
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Electron Beam Testing Technology by John T. L. Thong is a 462-page book published by Springer-Verlag New York Inc. in 2013.
The book deals with Computer engineering, Condensed Matter Physics, Spectroscopy and Microscopy and Optical and Electronic Materials.