Condensed Matter Optical Spectroscopy
Iulian Ionita
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Spectroscopic Ellipsometry
Practical Application to Thin Film Characterization
by James N. Hilfiker, Harland G. Tompkins
Momentum Pr · 2015 · Paperback
₹3,747
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About this book
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization by James N. Hilfiker & Harland G. Tompkins is a 159-page paperback edition published by Momentum Pr in 2015.
The book deals with Spectrum analysis.
Subjects
Book details
- ISBN-13
- 9781606507278
- ISBN-10
- 1606507273
- Authors
- James N. Hilfiker, Harland G. Tompkins
- Publisher
- Momentum Pr
- Published
- 2015
- Binding
- Paperback
- Pages
- 159
- Language
- English
- Condition
- New
- Subject
- Spectrum analysis
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