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Cover of Electromigration in Thin Films and Electronic Devices

Electromigration in Thin Films and Electronic Devices

Materials and Reliability

by Choong-Un Kim

Woodhead Publishing · 2011

₹28,137

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About this book

Electromigration in Thin Films and Electronic Devices: Materials and Reliability is written by Choong-Un Kim. This edition from Woodhead Publishing (2011) has 360 pages. It belongs to the Woodhead Publishing in materials series.

Topics covered include Electrodiffusion, Integrated circuits, Deterioration and Thin films.

Book details

ISBN-13
9781845699376
ISBN-10
1845699378
Author
Choong-Un Kim
Published
2011
Series
Woodhead Publishing in materials
Pages
360
Language
English
Condition
New
Subject
Mechanical

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