Advances in Biometric Person Authentication
Stan Z. Li, Jianhuang Lai, Tieniu Tan
₹4,865
Markov Random Field Modeling in Image Analysis
by Stan Z. Li
Springer · 2009
₹4,050
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About this book
Markov Random Field Modeling in Image Analysis is written by Stan Z. Li. This edition from Springer (2009) has 357 pages. It belongs to the Advances in pattern recognition series. This is the 3rd edition.
The book deals with Markov-Zufallsfeld, Mathematical models, Champs aléatoires de Markov and Parameterschätzung.
About the author: S. Z. Li (born 1958).
Book details
- ISBN-13
- 9781848002784
- ISBN-10
- 1848002785
- Author
- Stan Z. Li
- Publisher
- Springer
- Author dates
- S. Z. Li (born 1958)
- Published
- 2009
- Series
- Advances in pattern recognition
- Edition
- 3rd ed.
- Pages
- 357
- Language
- English
- Condition
- New
- Subject
- Digital techniques
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