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Cover of Charged Semiconductor Defects

Charged Semiconductor Defects

Structure, Thermodynamics and Diffusion

by Edmund G. Seebauer, Meredith C. Kratzer

Springer · 2008

₹8,792

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About this book

Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion by Edmund G. Seebauer & Meredith C. Kratzer is a 298-page book published by Springer in 2008. The book is part of the Engineering materials and processes series.

Topics covered include Semiconductors, Defects, Transport Phenomena Engineering Thermodynamics and Instrumentation Electronics and Microelectronics.

Book details

ISBN-13
9781848820586
ISBN-10
1848820585
Authors
Edmund G. Seebauer, Meredith C. Kratzer
Publisher
Springer
Published
2008
Series
Engineering materials and processes
Edition
2009 ed.
Pages
298
Language
English
Condition
New
Subject
Reference
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