Person and Family Centered Care
Jane H. Barnsteiner, R.n P.d, Walton, Mary K., R.N, Joanne Disch, R. N. Ph. D.
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Long-Term Reliability of Nanometer VLSI Systems
by Sheldon Tan, Mehdi Tahoori, Taeyoung Kim
Springer · 2018
₹3,122
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About this book
The publisher hasn't supplied a description for this edition. The details alongside are from the publisher's record.
Book details
- ISBN-13
- 9783030261726
- ISBN-10
- 3030261727
- Authors
- Sheldon Tan, Mehdi Tahoori, Taeyoung Kim
- Publisher
- Springer
- Published
- 2018
- Pages
- 240
- Language
- English
- Condition
- New
- Subject
- Textbooks & Study Material
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