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Cover of Active Probe Atomic Force Microscopy

Active Probe Atomic Force Microscopy

A Practical Guide on Precision Instrumentation

by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi

Springer International Publishing AG · 2024

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About this book

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation by Fangzhou Xia, Ivo W. Rangelow & others is a 366-page book published by Springer International Publishing AG in 2024.

Its main subjects are Biology.

Subjects

Book details

ISBN-13
9783031442322
ISBN-10
3031442326
Authors
Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi
Published
2024
Edition
1st ed. 2024
Pages
366
Language
English
Condition
New

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