Temporal QoS Management in Scientific Cloud Workflow Systems
Xiao Liu, Yun Yang, Jinjun Chen
₹3,089
Trace-Based Post-Silicon Validation for VLSI Circuits
252
by Xiao Liu, Qiang Xu
Springer International Publishing AG · 2013
₹7,744
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About this book
Published by Springer International Publishing AG in 2013, Trace-Based Post-Silicon Validation for VLSI Circuits: 252 by Xiao Liu & Qiang Xu runs to 108 pages.
Book details
- ISBN-13
- 9783319005324
- ISBN-10
- 3319005324
- Authors
- Xiao Liu, Qiang Xu
- Publisher
- Springer International Publishing AG
- Published
- 2013
- Edition
- 2013 ed.
- Pages
- 108
- Language
- English
- Condition
- New
- Subject
- Computers & Internet
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