Beam Diagnostics in Superconducting Accelerating Cavities

Name: Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher
Brand: Springer International Publishing AG
SKU: 9783319007588
Price: 6027.00 INR
Availability: InStock

The Extraction of Transverse Beam Position from Beam-Excited Higher

by Pei Zhang

Springer International Publishing AG · 2013 · Hardcover

₹6,027

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About this book

Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher is written by Pei Zhang. This hardcover edition from Springer International Publishing AG (2013) has 118 pages.

Topics covered include Electron beams, Nuclear physics, Physics and Particle acceleration.