
An Introduction to Surface Analysis by XPS and AES
John F. Watts, John Wolstenholme
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202
by Jens W. Tomm, Juan Jimenez
Springer International Publishing AG · 2016 · Hardcover
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Published by Springer International Publishing AG in 2016, Spectroscopic Analysis of Optoelectronic Semiconductors: 202 by Jens W.
The book deals with Optoelectronic devices.