Skip to content
Same-day shipping9% off: code GIG9
BooksBajar.com
Cover of Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering

by M. Birkholz

Wiley-VCH Verlag GmbH · 2005 · Hardcover

₹16,622

Free delivery. Nothing extra to pay at checkout.

  • Delivery in 3–5 days to any serviceable pincode in India, with tracking.
  • Cash on delivery. Pay when the parcel reaches you.
  • 15-day returns.
  • Express shipping. Same-day dispatch (Monday to Saturday), delivered all over India in 3–5 days.

Offer

Use code GIG9 at checkout and pay ₹16,122 for this book (save ₹500).

9% off every book, up to ₹500 off per order.

About this book

Thin Film Analysis by X-Ray Scattering by M.

Topics covered include X-ray spectroscopy, Thin films, Structural analysis (engineering) and States of matter.

About the author: Mario Birkholz (born 1958).

Book details

ISBN-13
9783527310524
ISBN-10
3527310525
Author
M. Birkholz
Publisher
Wiley-VCH Verlag GmbH
Author dates
Mario Birkholz (born 1958)
Published
2005
Edition
1
Binding
Hardcover
Pages
378
Language
English
Condition
New
Subject
Structural analysis

More in Structural analysis