Low-Voltage Low-Power Analog Integrated Circuits
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Verteilungsfreie Statistische Prüfverfahren
Eine anwendungsorientierte Darstellung
by E. Schaich, A. Hamerle
Springer · 1984 · Paperback
₹3,508
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About this book
Verteilungsfreie Statistische Prüfverfahren: Eine anwendungsorientierte Darstellung is written by E. Schaich & A. Hamerle.
Book details
- ISBN-13
- 9783540137764
- ISBN-10
- 3540137769
- Authors
- E. Schaich, A. Hamerle
- Publisher
- Springer
- Published
- 1984
- Binding
- Paperback
- Pages
- 362
- Language
- English
- Condition
- New
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