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Cover of Applied Scanning Probe Methods III

Applied Scanning Probe Methods III

Characterization

Springer · 2005 · Hardcover

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About this book

Applied Scanning Probe Methods III: Characterization is a 378-page hardcover edition published by Springer in 2005. It belongs to the Nanoscience and technology series.

Topics covered include Materials, Scanning probe microscopy, Industrial applications and Microscopy.

Book details

ISBN-13
9783540269090
ISBN-10
3540269096
Publisher
Springer
Published
2005
Series
Nanoscience and technology
Edition
2006 ed.
Binding
Hardcover
Pages
378
Language
English
Condition
New

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