Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Name: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
SKU: 9783540284055
Price: 15383.00 INR
Availability: InStock

Application to Rough and Natural Surfaces

by Gerd Kaupp

Springer-Verlag Berlin and Heidelberg GmbH & Co. K · 2005 · Hardcover

₹15,383

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About this book

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces is written by Gerd Kaupp. This hardcover edition from Springer-Verlag Berlin and Heidelberg GmbH & Co. K (2005) has 292 pages.

Its main subjects are Near-field microscopy, Atomic force microscopy, Scanning tunneling microscopy and Scanning probe microscopy.