X-Ray Scattering from Thin Films

Name: X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
SKU: 9783540620297
Price: 2465.00 INR
Availability: InStock

High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149

by U. Pietsch, T. Baumbach, V. Holy

Springer-Verlag Berlin and Heidelberg GmbH & Co. K · 1998

₹2,465

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About this book

X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149 by U. Pietsch, T. Baumbach & others is a 190-page book published by Springer-Verlag Berlin and Heidelberg GmbH & Co. K in 1998. The book is part of the Springer tracts in modern physics series.

Topics covered include Diffraction, Multilayered Thin films, Optical properties and Scattering.

About the author: Václav Holý (born 1953).