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Cover of Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

joint IAPR international workshop

by Edwin R. Hancock, Richard C. Wilson, Terry Windeatt

Springer · 2010

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About this book

Published by Springer in 2010, Structural, Syntactic, and Statistical Pattern Recognition: joint IAPR international workshop by Edwin R. Hancock, Richard C. Wilson & others runs to 758 pages. It belongs to the LNCS sublibrary series.

Its main subjects are Mustererkennung, Congresses, Pattern recognition systems and Pattern perception. Places discussed include Çeşme <2010>.

Book details

ISBN-13
9783642149795
ISBN-10
3642149790
Authors
Edwin R. Hancock, Richard C. Wilson, Terry Windeatt
Publisher
Springer
Published
2010
Series
LNCS sublibrary
Pages
758
Language
English
Condition
New
See all