
Tuning of Conducting Polymers
Sapana Jadoun, Nirmala Kumari Jangid
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Modelling, Simulation, Setup Building and Experiments
by Hui Xie, Cagdas Onal, Stéphane Régnier
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The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
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