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Cover of Atomic Force Microscopy Based Nanorobotics

Atomic Force Microscopy Based Nanorobotics

Modelling, Simulation, Setup Building and Experiments

by Hui Xie, Cagdas Onal, Stéphane Régnier

Springer

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From the publisher

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

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Book details

ISBN-13
9783642203282
ISBN-10
3642203280
Authors
Hui Xie, Cagdas Onal, Stéphane Régnier
Publisher
Springer
Condition
New
See all