Point Defects in Semiconductors II

Name: Point Defects in Semiconductors II: Experimental Aspects: 35
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
SKU: 9783642818349
Price: 7760.00 INR
Availability: InStock

Experimental Aspects: 35

by J. Bourgoin

Springer-Verlag Berlin and Heidelberg GmbH & Co. K · 2011

₹7,760

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About this book

Point Defects in Semiconductors II: Experimental Aspects: 35 by J. Bourgoin is a 295-page book published by Springer-Verlag Berlin and Heidelberg GmbH & Co. K in 2011.

Topics covered include Crystallography, Physics, Semiconductors and Dislocations in crystals.