Cover of Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß Für Röntgenoptik Und Mikroanalyse / Ve Congrès International

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß Für Röntgenoptik Und Mikroanalyse / Ve Congrès International

Name: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß Für Röntgenoptik Und Mikroanalyse / Ve Congrès International
Brand: Springer
SKU: 9783662228456
Price: 3508.00 INR
Availability: InStock

by Gottfried Möllenstedt

Springer

₹3,508

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From the publisher

The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E.

Description supplied by the publisher.