Structural, Syntactic, and Statistical Pattern Recognition

Name: Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop
Brand: Springer-Verlag New York Inc
SKU: 9783662444146
Price: 4260.00 INR
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Joint Iapr International Workshop

by Pasi Fränti, Gavin Brown, Marco Loog, Francisco Escolano, Marcello Pelillo

Springer-Verlag New York Inc · 2014 · Paperback

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About this book

Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop by Pasi Fränti, Gavin Brown & others is a 478-page paperback edition published by Springer-Verlag New York Inc in 2014.

The book deals with Computer science, Artificial intelligence, Pattern recognition systems and Database management.

Subjects

Book details

ISBN-13: 9783662444146
ISBN-10: 3662444143
Authors: Pasi Fränti, Gavin Brown, Marco Loog, Francisco Escolano, Marcello Pelillo
Publisher: Springer-Verlag New York Inc
Published: 2014
Edition: 2014 ed.
Binding: Paperback
Pages: 478
Language: English
Condition: New
Subject: Pattern recognition systems