Photo-Excited Charge Collection Spectroscopy

Name: Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-Effect Transistors
Brand: Springer Nature
SKU: 9789400763913
Price: 3944.00 INR
Availability: InStock

Probing the Traps in Field-Effect Transistors

by Jae Hoon Kim, Youn-gyoung Chang, Seongil Im

Springer Nature · 2013

₹3,944

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About this book

Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-Effect Transistors is written by Jae Hoon Kim, Youn-gyoung Chang & others. This edition is published by Springer Nature (2013).

Topics covered include Thin films, Field effect transistors, Solid state physics and Physics.