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Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

by Nicolas Brodusch, Raynald Gauvin, Hendrix Demers

Springer Nature · 2017 · Paperback

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About this book

Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization by Nicolas Brodusch, Raynald Gauvin & others is a 137-page paperback edition published by Springer Nature in 2017.

Topics covered include Electron microscopes.

Book details

ISBN-13
9789811044328
ISBN-10
9811044325
Authors
Nicolas Brodusch, Raynald Gauvin, Hendrix Demers
Published
2017
Edition
2018 ed.
Binding
Paperback
Pages
137
Language
English
Condition
New

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