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Cover of Reliability and Radiation Effects in Compound Semiconductors

Reliability and Radiation Effects in Compound Semiconductors

by Johnston Allan H.

World Scientific Publishing Company · 2009

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About this book

Published by World Scientific Publishing Company in 2009, Reliability and Radiation Effects in Compound Semiconductors by Johnston Allan H.

Its main subjects are Reliability, Effect of radiation on and Compound semiconductors.

Book details

ISBN-13
9789814277105
ISBN-10
981427710X
Author
Johnston Allan H.
Publisher
World Scientific Publishing Company
Published
2009
Pages
363
Language
English
Condition
New
Subject
Science, Tech & Medical

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