
Web-Based Learning
Jimmy Sun Fat Chan, Ronnie Chu Ting Cheung, Anthony Fong
₹5,353

A Concise Introduction
World Scientific Publishing Company
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This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.
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