
Helium Ion Microscopy
David C. Joy
₹4,242

by David C. Joy
Oxford University Press · 1995
Free delivery. Nothing extra to pay at checkout.
Monte Carlo Modeling for Electron Microscopy and Microanalysis is written by David C. Joy. This edition from Oxford University Press (1995) has 216 pages. It belongs to the Oxford series in optical and imaging sciences series.
Its main subjects are Computer simulation, Electron microscopy, Electron probe microanalysis and Monte Carlo method.
About the author: David C. Joy (born 1943).