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Cover of Helium Ion Microscopy

Helium Ion Microscopy

Principles and Applications

by David C. Joy

Springer-Verlag New York Inc. · 2013

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About this book

Helium Ion Microscopy: Principles and Applications is written by David C. Joy. This edition from Springer-Verlag New York Inc. (2013) has 64 pages. It belongs to the SpringerBriefs in materials series.

Topics covered include Field ion microscopy, Helium ions, Ion bombardment and Nanotechnology.

About the author: David C. Joy (born 1943).

Book details

ISBN-13
9781461486596
ISBN-10
1461486599
Author
David C. Joy
Publisher
Springer-Verlag New York Inc.
Author dates
David C. Joy (born 1943)
Published
2013
Series
SpringerBriefs in materials
Edition
2013 ed.
Pages
64
Language
English
Condition
New
Subject
Spectrum analysis

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