
Die Technik Der Negativ- Und Positivverfahren
Edwin Mutter, Josef Stüper, Kurt Michel
₹5,498

Atomic Scale Engineering by Forces and Currents
by Adam Foster, Werner A. Hofer
Free delivery. Nothing extra to pay at checkout.
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data.
Description supplied by the publisher.