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Cover of Scanning Probe Microscopy

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

by Adam Foster, Werner A. Hofer

Springer

₹4,663

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From the publisher

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data.

Description supplied by the publisher.

Book details

ISBN-13
9780387400907
ISBN-10
0387400907
Authors
Adam Foster, Werner A. Hofer
Publisher
Springer
Condition
New
See all