Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34
Brand: Springer-Verlag New York Inc.
SKU: 9780387465463
Price: 4495.00 INR
Availability: InStock

by José Pineda de Gyvez, Manoj Sachdev

Springer-Verlag New York Inc. · 2007

₹4,495

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About this book

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 is written by José Pineda de Gyvez & Manoj Sachdev. This edition is published by Springer-Verlag New York Inc. (2007).

Topics covered include Complementary Metal oxide semiconductors, Very large scale integration, Testing and Defects.