
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda de Gyvez, Manoj Sachdev
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Design, Test and Calibration
by Jose Pineda De Gyvez, Amir Zjajo
Springer Verlag · 2010
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Low-power High-resolution Analog to Digital Converters: Design, Test and Calibration is written by Jose Pineda De Gyvez & Amir Zjajo. This edition is published by Springer Verlag (2010).
Its main subjects are Systems engineering, Engineering, Computer-aided design and Electronics.