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Characterization in Silicon Processing
Butterworth-Heinemann Ltd · 1993
₹3,714
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About this book
Characterization in Silicon Processing is written by Yale Strausser. This edition from Butterworth-Heinemann Ltd (1993) has 250 pages. The book is part of the Materials characterization series series.
The book deals with Silicon, Surface chemistry, Semiconductor films and Electric conductors.
Book details
- ISBN-13
- 9780750691727
- ISBN-10
- 0750691727
- Author
- Yale Strausser
- Publisher
- Butterworth-Heinemann Ltd
- Published
- 1993
- Series
- Materials characterization series
- Pages
- 250
- Language
- English
- Condition
- New
- Subject
- Surface chemistry
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