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Cover of Hierarchical Modeling for VLSI Circuit Testing

Hierarchical Modeling for VLSI Circuit Testing

89

by Debashis Bhattacharya, John P. Hayes

Springer · 1989

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About this book

Hierarchical Modeling for VLSI Circuit Testing: 89 is written by Debashis Bhattacharya & John P. Hayes. This edition from Springer (1989) has 160 pages. It belongs to the The Kluwer international series in engineering and computer science series.

Topics covered include Computer simulation, Integrated circuits, Testing and Very large scale integration.

About the author: Debashis Bhattacharya (born 1961).

Book details

ISBN-13
9780792390589
ISBN-10
079239058X
Authors
Debashis Bhattacharya, John P. Hayes
Publisher
Springer
Author dates
Debashis Bhattacharya (born 1961)
Published
1989
Series
The Kluwer international series in engineering and computer science
Edition
1990 ed.
Pages
160
Language
English
Condition
New
See all