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Cover of Defects in HIgh-k Gate Dielectric Stacks

Defects in HIgh-k Gate Dielectric Stacks

Nano-electronic Semiconductor Devices

by Evgeni Gusev

Springer · 2006 · Hardcover

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About this book

Defects in HIgh-k Gate Dielectric Stacks: Nano-electronic Semiconductor Devices by Evgeni Gusev is a 492-page hardcover edition published by Springer in 2006.

Topics covered include Semi-conductors & super-conductors, Technology, Technology & Industrial Arts and Material Science.

Book details

ISBN-13
9781402043659
ISBN-10
1402043651
Author
Evgeni Gusev
Publisher
Springer
Published
2006
Edition
1 edition
Binding
Hardcover
Pages
492
Language
English
Condition
New
See all