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Cover of Defects in High-k Gate Dielectric Stacks

Defects in High-k Gate Dielectric Stacks

Nano-Electronic Simiconductors Devices: 220

by Evgeni Gusev

Kluwer Academic Pub · 2006 · Paperback

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About this book

Defects in High-k Gate Dielectric Stacks: Nano-Electronic Simiconductors Devices: 220 by Evgeni Gusev is a 492-page paperback edition published by Kluwer Academic Pub in 2006.

The book deals with Dielectrics, Semiconductors, Semi-conductors & super-conductors and Technology.

Book details

ISBN-13
9781402043666
ISBN-10
140204366X
Author
Evgeni Gusev
Published
2006
Edition
2006 ed.
Binding
Paperback
Pages
492
Language
English
Condition
New
See all