
Defects in HIgh-k Gate Dielectric Stacks
Evgeni Gusev
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Nano-Electronic Simiconductors Devices: 220
by Evgeni Gusev
Kluwer Academic Pub · 2006 · Paperback
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Defects in High-k Gate Dielectric Stacks: Nano-Electronic Simiconductors Devices: 220 by Evgeni Gusev is a 492-page paperback edition published by Kluwer Academic Pub in 2006.
The book deals with Dielectrics, Semiconductors, Semi-conductors & super-conductors and Technology.