Advanced Test Methods for SRAMs

Name: Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled
Brand: Springer-Verlag New York Inc.
SKU: 9781441909374
Price: 7733.00 INR
Availability: InStock

Effective Solutions for Dynamic Fault Detection in Nanoscaled

by Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo

Springer-Verlag New York Inc. · 2009

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About this book

Published by Springer-Verlag New York Inc. in 2009, Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled by Alberto Bosio, Patrick Girard & others runs to 171 pages.

The book deals with Systems engineering, Engineering, Computer-aided design and Random access memory.

About the author: Patrick Girard (born 1950).

Subjects

Book details

ISBN-13: 9781441909374
ISBN-10: 1441909370
Authors: Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo
Publisher: Springer-Verlag New York Inc.
Author dates: Patrick Girard (born 1950)
Published: 2009
Edition: 2010 ed.
Pages: 171
Language: English
Condition: New
Subject: Computer-aided design