Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Name: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Brand: Springer
SKU: 9781461407874
Price: 4439.00 INR
Availability: InStock

by Ruijing Shen, Sheldon X. -D Tan, Hao Yu

Springer

₹4,439

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From the publisher

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.

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