Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
₹4,914
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Books by Pierre-Richard Dahoo
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Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics
Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
₹10,199