Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics

Name: Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Brand: Wiley-ISTE
SKU: 9781848219366
Price: 10199.00 INR
Availability: InStock

Reliability of Multiphysical Systems, 2)

by Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet

Wiley-ISTE · 2016

₹10,199

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About this book

Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2) is written by Pierre-Richard Dahoo, Abdelkhalak El Hami & others. This edition from Wiley-ISTE (2016) has 316 pages.

Topics covered include Chemical processes.