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Cover of Nanometer-scale Defect Detection Using Polarized Light

Nanometer-scale Defect Detection Using Polarized Light

by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

Wiley & Sons, Incorporated, John · 2016

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About this book

Published by Wiley & Sons, Incorporated, John in 2016, Nanometer-scale Defect Detection Using Polarized Light by Pierre-Richard Dahoo, Philippe Pougnet & others runs to 316 pages.

Its main subjects are Chemical processes.

Book details

ISBN-13
9781119329657
ISBN-10
1119329655
Authors
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Publisher
Wiley & Sons, Incorporated, John
Published
2016
Pages
316
Language
English
Condition
New

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