
Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt, Ricardo Reis
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by Bushnell M.l
SPRINGER · 2000 · Hardcover
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by Bushnell M.It belongs to the Frontiers in electronic testing series.
Its main subjects are Digital integrated circuits, Integrated circuits, Mixed signal circuits and Semiconductor storage devices.
About the author: Michael L. Bushnell (born 1950).