Introduction to the Physics of Electrons in Solids
Brian K. Tanner
₹11,641
X-Ray Metrology in Semiconductor Manufacturing
by Brian K. Tanner, D. Keith Bowen
CRC Press · 2018
₹3,026
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About this book
X-Ray Metrology in Semiconductor Manufacturing by Brian K. Tanner & D. Keith Bowen is a book published by CRC Press in 2018. It first appeared in 2006.
Its main subjects are Semiconductors and Integrated circuits.
Book details
- ISBN-13
- 9781420005653
- ISBN-10
- 1420005650
- Authors
- Brian K. Tanner, D. Keith Bowen
- Publisher
- CRC Press
- Published
- 2018
- First published
- 2006
- Language
- English
- Condition
- New
- Subject
- Integrated circuits
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