Metrology and Physical Mechanisms in New Generation Ionic Devices
Umberto Celano
₹7,759
Electrical Atomic Force Microscopy for Nanoelectronics
Springer Nature Switzerland AG · 2019 · Hardcover
₹13,868
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About this book
Electrical Atomic Force Microscopy for Nanoelectronics is written by Umberto Celano. This hardcover edition from Springer Nature Switzerland AG (2019) has 408 pages.
Book details
- ISBN-13
- 9783030156114
- ISBN-10
- 3030156117
- Author
- Umberto Celano
- Publisher
- Springer Nature Switzerland AG
- Published
- 2019
- Edition
- 1st ed. 2019
- Binding
- Hardcover
- Pages
- 408
- Language
- English
- Condition
- New
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