Metrology and Physical Mechanisms in New Generation Ionic Devices
Umberto Celano
₹7,759
Electrical Atomic Force Microscopy for Nanoelectronics
Springer · 2018
₹2,791
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About this book
Electrical Atomic Force Microscopy for Nanoelectronics by Umberto Celano is a 240-page book published by Springer in 2018.
Book details
- ISBN-13
- 9783030156121
- ISBN-10
- 3030156125
- Author
- Umberto Celano
- Publisher
- Springer
- Published
- 2018
- Pages
- 240
- Language
- English
- Condition
- New
- Subject
- Society & Social Sciences
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