Electrical Atomic Force Microscopy for Nanoelectronics
Umberto Celano
₹13,868
Metrology and Physical Mechanisms in New Generation Ionic Devices
Springers · 2015
₹3,728
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About this book
Topics covered include Thin films, Electronic apparatus and appliances and Metrology.
Book details
- ISBN-13
- 9783319395319
- ISBN-10
- 3319395319
- Author
- Umberto Celano
- Publisher
- Springers
- Published
- 2015
- Pages
- 240
- Language
- English
- Condition
- New
- Subject
- Reference & Dictionaries
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