
Fundamentals and Applications of Anion Separations
Bruce A. Moyer
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by David H. Krinsley, Sam Boggs, N. Keith Tovey, Kenneth Pye
Cambridge University Press · 2005 · Paperback
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Published by Cambridge University Press in 2005, Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks by David H.This is the revised edition.
The book deals with Sedimentary rocks, Scanning electron microscopy, Sediments (Geology) and Rasterelektronenmikroskopie.